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  3. IEC/TR 63133 Ed. 1.0 en:2017 PDF

IEC/TR 63133 Ed. 1.0 en:2017 PDF

IEC/TR 63133 Ed. 1.0 en:2017 PDF

Name:
IEC/TR 63133 Ed. 1.0 en:2017 PDF

Published Date:
10/11/2017

Status:
Active

Description:

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

Publisher:
International Electrotechnical Commission - Technical Report

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$43.5
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IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
Edition : 1.0
File Size : 1 file , 720 KB
Note : This product is unavailable in Russia, Belarus, Ukraine, Canada
Number of Pages : 17
Published : 10/11/2017

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